X-ray Raman scattering study of aligned polyfluorene
نویسندگان
چکیده
We present a non-resonant inelastic x-ray scattering study at the carbon Kedge on aligned poly[9,9-bis(2-ethylhexyl)-fluorene-2,7-diyl] and show that the x-ray Raman scattering technique can be used as a practical alternative to x-ray absorption measurements. We demonstrate that this novel method can be applied to studies on aligned π-conjugated polymers complementing diffraction and optical studies. Combining the experimental data and a very recently proposed theoretical scheme we demonstrate a unique property of x-ray Raman scattering by performing the symmetry decomposition on the density of unoccupied electronic states into sand p-type symmetry contributions.
منابع مشابه
A High-Resolution Large-Acceptance Analyzer for X-ray Fluorescence and Raman Spectroscopy
A newly designed multi-crystal X-ray spectrometer and its applications in the fields of X-ray fluorescence and X-ray Raman spectroscopy are described. The instrument is based on 8 spherically curved Si crystals, each with a 3.5 inch diameter form bent to a radius of 86 cm. The crystals are individually aligned in the Rowland geometry capturing a total solid angle of 0.07 sr. The array is arrang...
متن کاملLength scales in orientational order of vertically aligned single walled carbon nanotubes
We have studied the orientational order in films of vertically aligned single walled carbon nanotubes, by means of resonant Raman spectroscopy, resonant X-ray absorption, and direct imaging. These methods investigate the hierarchical morphology at different length scales. Here, we discuss the systematic comparison of orientational order as function of wavelength in films with different inherent...
متن کاملMagnetically aligned single wall carbon nanotube films: preferred orientation and anisotropic transport properties
Thick films of single wall carbon nanotubes ~SWNT! exhibiting in-plane preferred orientation have been produced by filter deposition from suspension in strong magnetic fields. We characterize the field-induced alignment with x-ray fiber diagrams and polarized Raman scattering, using a model which includes a completely unaligned fraction. We correlate the texture parameters with resistivity and ...
متن کاملAluminum Impurities in Silicon: Investigation of X-ray Raman Scattering in Total Reflection X-ray Fluorescence Spectroscopy
Total Reflection X-ray Fluorescence (TXRF) using Synchrotron Radiation from the Stanford Synchrotron Radiation Laboratory (SSRL) has been used to study Al impurities on Si wafer surfaces. For primary excitation energies below the Si K absorption edge an inelastic resonance scattering due to resonant xray Raman scattering is observed. This scattering dominates the background behavior of the Al K...
متن کاملX-ray Absorption Spectroscopy and X-ray Raman Scattering of Water and Ice; An Experimental View
Here we present a review of x-ray absorption spectroscopy and x-ray Raman scattering with the perspective to understand the spectra of water including changes with temperature, mass of the water molecule and presence of monovalent ions. The different detection schemes are discussed and it is concluded that transmission x-ray absorption measurements, using a small area where the thickness is uni...
متن کامل